SL | Component Type | Parametric Test | Screening Tests |
---|---|---|---|
1 | Transistor | Collector base Cut Off Current ICBO Emitter base Cut Off Current, IEBO Collector Emitter Saturation Voltage, VCE (Sat) Base Emitter Saturation Voltage, VBE (sat) hFE forward current ratio Leakage currents or cut off currents, ICE |
Visual & Dimensional Stabilize Bake Thermal cycling/shock Leak Testing Acceleration HTRB Burn-in |
2 | Diodes Zeners | Forward Voltage, VF Reverse current, Ir Reverse Recovery time, trr Forward Recovery time, trr Breakdown voltage VR Zener Voltage, VZ |
Visual & Dimensional Stabilize Bake Thermal cycling/shock Leak Testing Acceleration HTRB Burn-in |
3 | Integrated Circuits | Functional DC Parametric Characteristics |
Visual & Dimensional Stabilize Bake Thermal cycling/shock Leak Testing Acceleration HTRB Burn-in |