Active Components Test Capabilities

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SL Component Type Parametric Test Screening Tests
1 Transistor Collector base Cut Off Current ICBO
Emitter base Cut Off Current, IEBO
Collector Emitter Saturation Voltage, VCE (Sat)
Base Emitter Saturation Voltage, VBE (sat)
hFE forward current ratio
Leakage currents or cut off currents, ICE
Visual & Dimensional
Stabilize Bake
Thermal cycling/shock
Leak Testing
Acceleration
HTRB
Burn-in
2 Diodes Zeners Forward Voltage, VF
Reverse current, Ir
Reverse Recovery
time, trr
Forward Recovery time, trr
Breakdown voltage VR
Zener Voltage, VZ
Visual & Dimensional
Stabilize Bake
Thermal cycling/shock
Leak Testing
Acceleration
HTRB
Burn-in
3 Integrated Circuits Functional
DC Parametric Characteristics
Visual & Dimensional
Stabilize Bake
Thermal cycling/shock
Leak Testing
Acceleration
HTRB
Burn-in